Engineering publications brought to you by Mark Allen

Test & Measurement

Texas Instruments Incorporated introduces two configurable analog front ends (AFE)

Taking the long view: Interview with Alex Davern, COO of National Instruments

A holistic approach: Equipment rental brings flexibility to design engineers

Teledyne Technologies to acquire LeCroy

Infineon ships two billionth sensor chip

Modular Solutions for Electronics NPI and Manufacturing Seminar

Peratech creates innovative ‘electronic nose’ using QTC technology

Baolab to create low cost reconfigurable IMUs

Testing efficiently an increasing challenge for design engineers

18 slot PXI Express chassis boosts uptime

MathWorks and Agilent seminar: Data Analysis, Measurement and System Verification

Lightning sensor ic is first to target low power, portable applications