Tackling test troubles

New Electronics’ Test & Measurement Design Day – being held in Reading on May 15 – is intended to help you to make sense of an increasingly complex technology sector. Starting with a keynote from a leading test user, the day comprises three technical streams: addressing embedded test, wireless test and software based test. Anritsu will be addressing MIMO test strategies as part of the wireless stream. According to the company, MIMO technology includes new methods for both signal processing and rf coupling. These technologies will be reviewed in terms of general principles, and then the specific architecture and implementation in 3GPP LTE. Based on this architecture, a ‘step by step’ systematic test strategy will be proposed and discussed, which it claims will enable complete system test and verification. QualiSystems, meanwhile, will be explaining the role of functional test automation. According to the company, this sector is now evolving from a collection of various tools to an enterprise quality management platform. Using its TestShell software, the company will show how to automate and manage the functional testing process. This approach, it claims, turns the testing process into a quality optimisation solution. Agilent will give an overview of some of communications standards and their design implications. It will look at the tools and technologies available, plus cover practical physical layer measurement techniques. Tektronix, meanwhile, claims a concurrent design platform that encompasses simulation and measurement in parallel can help guide a project from concept to verification. It will illustrate this approach using an fpga based transceiver board. Alongside the high quality technical presentations, you will have the opportunity to get hands on with new technologies. And there will be a table top exhibition.