Achievable solar cell testing
Test instruments specialist, Keithley Instruments is introducing an upgraded version of its semiconductor characterisation system, which will make it suitable for solar cell testing.
The software upgrade of its 4200-SCS, the KTEI V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system's capacitance voltage measurement capability and support for the company's new nine slot model 4200-SCS instrument chassis.
The KTEI V7.2, allows it to support drive level capacitance profiling (dlcp) – a new solar cell testing technique that was difficult to perform accurately using earlier test solutions. dlcp provides defect density information on thin film solar cells.
Keithley's existing model 4200-CVU capacitance voltage unit cards can be readily modified to support this testing technique. The 4200-CVU's frequency range has been expanded to 1kHz to 10MHz from 10kHz to 10Mz to support dlcp testing. This extended frequency range also expands the system's applications, providing support for testing flat panel lcds and organic semiconductors such as oleds.
