Based on the flexible and scalable PXIe modular platform, the TS-960e-5G provides a compact integrated test solution that can be configured with up to 24 independent VNA channels, up to 256 dynamic digital channels with per-channel parametric measurement units (PMUs) and a wide range of digital and analogue instrument options. It has been designed to offer users a compact test system that can support both functional and DC parametric test capabilities.
It is available with 5G software tools and with a digital vector conversion utility that support ASCII, WGL, STIL, VCD, eVCD and ATP vector formats.
“The unique requirements of 5G test applications and the evolutionary nature of the technology demand cutting-edge test solutions that are ready for environments from lab to production test,” said Major General Stephen T. Sargeant, USAF (Ret.), CEO of Marvin Test Solutions. “Our TS-960e-5G delivers the performance and ease of use that MTS is known for as well as unrivaled Cost of Test and world-class support.”
Designed for production test applications requiring integration with an automated handler, the TS-960e-5G is available with an inTEST manipulator which provides precise positioning of the test head and the flexibility to interface to automated probers and device handlers. The TS-960e-5G's device interface board (DIB) / receiver interface is designed to be compatible with virtually any device handler.
Renesas-IDT, a leading manufacturer of comprehensive semiconductor solutions, has teamed with Marvin Test Solutions to validate package test performance of their beamforming products on the TS-900e-5G System.
“Marvin Test Solutions is leading the effort to deliver laboratory grade instrument performance in the 5G beamforming production test environment,” commented Scott Martin, Vice President of Product and Test Engineering at Renesas-IDT. “The high throughput capability of the TS-960e-5G test system will be a great asset for us as demand for this technology continues to grow.”
The TS-960e-5G core system includes ATEasy, a comprehensive suite of software tools that allows users to quickly develop and easily maintain test applications. Digital and parametric testing, and SPI/I2C interface support to functionally control and monitor the device under test are supported in the ATEasy Test Executive and Test Development Suite, as well as all instrument drivers, virtual instrument panels, system self-test, and ICEasy which facilitates device test development and characterization.
