Measuring on the nanoscale could mean more accurate devices
The National Physical Laboratory (NPL) is working on ways to provide more reliable measurement of the electrical properties of materials used in nanotechnology – which could lead to much more accurate devices in the future.
NPL researchers have discovered that, by combining textural analysis, through electron backscatter diffraction, with piezoresponse force microscopy, quantitative measurements of piezoelectric properties can be made at a scale of 25nm.
The work is expected to provide practical information for the future development of nanostructured ferroelectric materials for memories, nano actuators and sensors.
