With the spectrum analyser option installed, VectorStar can conduct single connection VNA and spectrum-based measurements to create a more efficient and accurate testing environment to verify active and passive devices during the design, troubleshooting, or characterisation stages.
The spectrum analyser option is compatible with all baseband VectorStar models – broadband and banded system configurations. Integrating VNA/spectrum analyser capability provides engineers with a method to quickly transfer a challenging VNA measurement to the spectrum analyser, but without having to change the test setup or using multiple instruments. It is particularly helpful for applications involving mixers and amplifiers, including those with multiple outputs or input-output comparisons.
Simultaneous, sequential S-parameter and spectrum analysis are possible with the VNA-spectrum analyser instrument. Spectral domain measurements of harmonics, spurious, other distortion products, and general frequency content can be made effectively with the single-instrument solution. It allows engineers to analyse VNA-like and spectrum-analyser-like response of a device under test (DUT).
The VNA-spectrum analyser solution is intended for on-wafer measurements, as it leverages VectorStar’s ability to make a direct connection to an on-wafer device. Mounting and demounting of on-wafer devices, which can cause major errors in measurement, have been eliminated with the solution. Power calibration can be conducted at the probe tip for greater accuracy and repeatability.
Engineers can also use the VNA source as a stimulus and any port as a receiver for scalar measurements. Using the multiple test ports on the VNA delivers multi-channel spectrum analysis that is synchronised with the internal swept signal generators. Spectrum analysis for broadband and banded is also available with Anritsu or other millimetre (mmWave) modules.
Two configurations are available in the spectrum analyser option. The standard VNA mode supports point-based spectrum analysis for faster measurements, making it well suited for known signal analysis.
For unknown signal analysis, the solution can be configured with a traditional sweep-based spectrum analyser.
