The XGS 16000 is a 16 Megapixel (Mp) sensor that has been designed to provide high quality, global shutter imaging for factory automation applications including robotics and inspection systems.
Consuming only 1W at 65 frames per second (fps), the XGS 16000 delivers performance at low power and makes it one of the best in class for power consumption, while also offering one of the highest resolutions available for standard 29 x 29 mm industrial cameras.
The XGS 16000 shares a common architecture and footprint with other XGS CMOS image sensors which will enable manufacturers to use a single camera design to develop products in different resolutions. Supporting up to 65 frames per second readout at full resolution, the sensor is available in various speed grades, all with Bayer colour or monochrome options.
According to the company developers of camera systems used in intelligent transportation systems, machine vision inspection and industrial automation applications will benefit from the high resolution and high frame rate of the XGS 16000. ON Semiconductor’s global shutter pixel technology addresses the limitations associated with rolling shutter pixels in these applications. Artifacts such as motion blur and distortion are avoidable using a global shutter approach. This is increasingly important in automation, inspection, and identification applications.
The XGS 16000 has been designed in a unique 1:1 square aspect ratio, which helps maximize the image capture area within the optical circle of the camera lens and ensure optimal light sensitivity. Because of this, the sensor is compatible with 29 mm2 industry standard camera formats using commercially available C-Mount lenses. This provides optimal use of the available field of view and sensor area for the physical size of the camera.
To simplify new camera designs, ON Semiconductor offers colour and mono versions of the XGS 16000 X-Cube and X-Celerator developer kits. High-speed conversion to MIPI interface examples are provided with the reference design kits to allow for quicker integration into standard FPGA evaluation environments.
