The ISL70617SEH enables higher common mode rejection ratio and power supply rejection ratio at all gain settings. Designers can program the gain from 0.1 to 10,000 using two external resistors. The device is wafer-by-wafer guaranteed to 75krad (Si) with a low dose rate exposure of 10mrad/s, which more closely resembles the space environment than the high dose rate testing.
The ISL70617SEH leverages silicon on insulator process to provide single event latch up and single event burnout robustness of 60MeV in heavy ion environments. Its single event transient performance of <10µ/sec eliminates the need for extra filtering. It operates in temperatures ranging from -55 to 125°C and from an input of ±4V to ±18V.
The ISL70517SEH single ended instrumentation amplifier offers similar features but implements a differential input and rail-to-rail single ended output.
The ISL70617SEH and the ISL70517SEH are available in 24 lead ceramic flatpack packages.
