Utilising OLCR (optical low-coherence reflectometry) technology, the AQ7420 has been developed for the internal structure analysis of optical modules and the visualisation of microcracks in optical connectors.
It provides a spatial resolution of 40 µm and back reflection measurement sensitivity down to -100 dB or lower, with no spurious noise. Combined with the optional sensor head unit, users can measure insertion loss simultaneously alongside back reflection, making the AQ7420 a highly efficient and cost-effective reflectometer for optical market applications.
Having conducted research into silicon photonics and producing fibre optic connectors, Yokogawa identified several emerging demands that could not be satisfied with existing solutions. These included: even more reduction of spurious noise; simultaneous measurement of back reflection and insertion loss; enhanced stability of measured waveforms; and faster measurement time.
The objective, therefore, was to develop a new solution that could meet these requirements, the result of which is the new AQ7420 high-resolution reflectometer. Two models are available: single-wavelength (1310 nm) and two-wavelength (1310 and 1550 nm).
Also released is control software for Windows 11, an optional dedicated sensor head for loss measurement, various master codes (compatible with a variety of connector types) and a distance adjustment code to adjust the measurement starting position.
Principal among the main new features is the ability of the AQ7420 to reduce spurious noise. With conventional OLCR/OFDR technology-based devices, spurious (ghost) noise is often observable in areas where there is no actual reflection (depending on the characteristics of the equipment), leading to misjudgements. In such situations, correct waveform analysis relies heavily on users with specialist knowledge. By contrast, the new AQ7420 features technology that greatly reduces spurious noise, with ease-of-analysis among its prominent attributes.
Another significant feature is the potential to measure back reflection and insertion loss simultaneously. Conventional OLCR/OFDR instruments are often unable to inspect back reflection amount accurately due to the poor measurement accuracy of the vertical axis (amount of reflection level). The AQ7420 high-resolution reflectometer counters this issue by enabling measurement with an uncertainty of ±3dB. Furthermore, by taking advantage of the optical sensor head, users can measure insertion loss simultaneously with an uncertainty of ±0.02dB.
Another feature is faster measurement time. Compared with the previous-generation product (AQ7410), the measurement time of the new AQ7420 high-resolution reflectometer is around 50% quicker, approximately 6 seconds compared with 12 seconds beforehand.
Major Target Markets
- Companies and organisations conducting silicon photonics research
- Manufacturers running productions lines for optical connectors and components
- Any company involved in the analysis of defective optical components
