Engineering publications brought to you by Mark Allen

Test

J-Link compact models for verification and test beds

Automatic probe system for advanced 3D chips

Next generation Genesys+ power supply released

ICs to bring longer battery life to portable devices

Novel navigational approach to product development

Developing code that is secure by construction

Helping customers determine what sensor they need

Programmable AC power source delivers DC power

Anritsu launches BER test solution for 100G-EPON

Arbitary waveform generators for testing MIPI PHYs

Developments in low cost VNAs to find new applications

electronica - Test solution for remote keyless entry systems