Engineering publications brought to you by Mark Allen

Memory

Samsung unveils first eMRAM test chip based on 28nm FD-SOI process

Cadence unveils memory design and verification tool

Microchip launches low-voltage 64-megabit serial quad I/O SuperFlash memory

Ideal memory material conceptualised

Researchers create magnetoelectric memory

Phenomenon to improve data processing and storage

Collaboration to deliver NVMe-oF architectures

Samsung introduces V-NAND memory solutions

Enterprise-Class SSDs come with 64-Layer 3D Flash Memory

Single package SSDs with 64-layer 3D flash memory

3D NAND hits four bits per cell

Breakthrough in spin wave data processing