TDR, S-Parameters and Differential Measurements webcast
With the increase in speed of digital system design into the gigahertz region, frequency dependent effects are more prominent. Agilent's webcast looks at the proliferation of high speed serial data formats in today's digital standards and how they demand differential circuit topology.
A paradigm shift in measurement technology is required to achieve the design goals of the advanced differential physical layer. It is now necessary to consider both time and frequency domain analysis to obtain proper characterization. This presentation reviews TDR, S-Parameters, and Differential measurements using a TDR.
The webcast is on 7th April 2009 and commences at 1pm GMT and online registration is required. To register click here.
