Engineering publications brought to you by Mark Allen

Interviews

Test & Measurement

Scope for more business: Interview with Roland Steffen, Rohde & Schwarz

System Design

Onwards and upwards: Interview with Plextek group chariman Colin Smithers

CPUs

Shall we dance? Interview with Gregg Lowe, Freescale

Test & Measurement

Change is the constant: Interview with Dr James Truchard, National Instruments

A catalogue of success: Interview with Digi-Key president Mark Larson

Programmability will win out: Interview with Nigel Toon, chief executive, XMOS

Consumer

Interview with Menno Treffers, chairman, Wireless Power Consortium

Power

Grasping the nettle: Interview with Keith Attwood, ceo, e2v

EDA & Design Software

Chip design’s recycle cycle: Interview with Aart de Geus, chairman and co chief executive, Synopsys

Mixed Signal & Analogue

Implementing change: Interview with Dr Carsten Suckrow, vp of sales for EMEA, Analog Devices

Embedded Software

Moving forward hand in hand: Interview with Andreas Pabinger, vp of operations for EMEA, Wind River

Test & Measurement

Taking the long view: Interview with Alex Davern, COO of National Instruments