Programmable pattern generator supports 40Gb/s data rates

With 200fs random jitter and 8ps rise time performance, the PPG4001 is said to deliver the performance and signal quality critical for serial data testing at 40Gb/s. In addition to high data rates and high quality output signals, the device offers built-in jitter stressing capabilities and includes options for high frequency jitter insertion (RJ, SJ, and BUJ) as well as low frequency SJ. These built-in options are front panel push button or remotely programmable and are optimised to allow for comprehensive stress testing of optical modules and electrical SERDES devices. Ease of use features include a front panel touchscreen with a simple GUI and no instrument reconfiguration or characterisation in order to move from one test standard to the next. It also offers a range of programmable data rates and patterns, covering all of the operating conditions needed to verify product performance and functionality.