Programmable pattern generator supports 40Gb/s data rates
1 min read
Tektronix has launched a fully integrated programmable pattern generator.
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With 200fs random jitter and 8ps rise time performance, the PPG4001 is said to deliver the performance and signal quality critical for serial data testing at 40Gb/s.
In addition to high data rates and high quality output signals, the device offers built-in jitter stressing capabilities and includes options for high frequency jitter insertion (RJ, SJ, and BUJ) as well as low frequency SJ.
These built-in options are front panel push button or remotely programmable and are optimised to allow for comprehensive stress testing of optical modules and electrical SERDES devices.
Ease of use features include a front panel touchscreen with a simple GUI and no instrument reconfiguration or characterisation in order to move from one test standard to the next.
It also offers a range of programmable data rates and patterns, covering all of the operating conditions needed to verify product performance and functionality.