With its hyMap sub-page-based flash translation layer, the X1 provides much improved random write performance, minimal write amplification and high endurance without an external DRAM. The FlashXE (eXtended Endurance) read-channel includes calibration, error correction with soft-decoding and error prevention mechanisms for a wide range of flash technology including SLC, pSLC, 3D MLC, 3D TLC and the next generation of NAND flashes.
The hyReliability flash management features improved wear levelling, read-disturb management and best-in-class power-fail robustness. In addition, advanced protection against radiation and soft errors including end-to-end datapath protection, SRAM ECC and a low-alpha package ensure operation even under more demanding conditions. The controller achieves transfer speeds of up to 550 MB/s. Exhaustive health-monitoring data exceeding the usual S.M.A.R.T. scope is provided together with lifetime estimation tools.
X1 is the latest addition to Hyperstone’s portfolio of NAND flash controllers and will initially be available in 144-ball TFBGA (10.4 x 10.4 x 1.1 mm) and 124-ball TFBGA (9 x 9 x 1.2 mm) packages, qualified for the industrial temperature range (-40 to +85°C).
Mass-production samples and firmware are available now
