Engineering publications brought to you by Mark Allen

Electronics

Tektronix claims new test category with launch of mixed domain scope

DRAM manufacturers must transition process nodes downward warns IHS

8bit flash mcus target led lighting applications

Picocell, femtocell SoCs sampling

Issues and solutions for variation aware custom IC design

Micron debuts first 1Gbit SPI NOR flash memory

Memory test and repair solution for ARM processor cores

Renesas adds to R-Car automotive SoC series

Digital differential pressure sensors feaure low measurement ranges

All flash enterprise storage is 10x faster than disk centric arrays

GWS series – ‘Green’ power supplies from TDK-Lambda

Alternative pathway technique holds promise for photon based chips