First complete MIPI M-PHY test suite unveiled by Agilent
Agilent Technologies has announced a comprehensive MIPI M-PHY test solution for the mobile computing market. The test and measurement specialist claims it will help designers turn on, debug and validate all layers of their M-PHY devices, including physical and protocol layers, at speeds up to 5.8 Gb/sec.
The Agilent solution consists of oscilloscopes, protocol analysers and exercisers, as well as bit error rate testers using custom M-PHY stimulus software. Each instrument comes with custom M-PHY-ready software to support design teams through the entire product design process.
"Working closely with customers developing early M-PHY-based silicon allowed us to provide robust M-PHY test solutions even before the final specification became available," said Roland Scherzinger, Agilent's MIPI program manager. "In addition, we were happy to share our experience in testing high speed serial technologies in the MIPI workgroups, ensuring robust M-PHY specifications in terms of signal integrity and testability."
