Boundary scan range expanded

The latest member of the SCANBOOSTER product line is compliant with the PCI Express External Cabling 1.0 Specification and supports Jtag/boundary scan tests, VarioTAP emulation tests, in system programming for plds and fpgas, and in system programming for flash serial eeproms of moderate size. The device features two test access ports (TAPs) and supports programmable TCK frequencies of up to 16MHz. Exchangeable TAP interface cards make the controller flexible and, says Goepel, future proofed. Test bus parameters such as output and input voltage as well as output and input impedance can be programmed independently for both TAPs. Additionally, the controller provides 32 voltage level programmable, dynamic Parallel I/O, two a/d and d/a converter channels, external trigger signals, and three static I/O. As such, says the company, SCANBOOSTER/PEC is ready to be deployed for extended test and pld/flash programming operations. Test and in system programming applications developed for the ScanBooster/PEC are cross compatible with other controllers in the ScanBooster series or with the SCANFLEX boundary scan platform. Optionally, a plug in card is available as a bridge from PCI Express to Cabled PCI Express. SCANBOOSTER/PEC is supported by the SYSTEM CASCON software, said to be the only integrated development environment for IEEE1149.x to feature a mixed signal programming language (CASLAN). This offers more than 40 tools for automatic test program generation, pin fault diagnostics, VarioTAP emulation test, in system programming, debugging, and schematic and layout visualisation.